Maximal margin classification for metric spaces

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摘要

In order to apply the maximum margin method in arbitrary metric spaces, we suggest to embed the metric space into a Banach or Hilbert space and to perform linear classification in this space. We propose several embeddings and recall that an isometric embedding in a Banach space is always possible while an isometric embedding in a Hilbert space is only possible for certain metric spaces. As a result, we obtain a general maximum margin classification algorithm for arbitrary metric spaces (whose solution is approximated by an algorithm of Graepel et al. (International Conference on Artificial Neural Networks 1999, pp. 304–309)). Interestingly enough, the embedding approach, when applied to a metric which can be embedded into a Hilbert space, yields the support vector machine (SVM) algorithm, which emphasizes the fact that its solution depends on the metric and not on the kernel. Furthermore, we give upper bounds of the capacity of the function classes corresponding to both embeddings in terms of Rademacher averages. Finally, we compare the capacities of these function classes directly.

论文关键词:Classification,Maximum margin,Metric spaces,Embedding,Pattern recognition

论文评审过程:Received 9 February 2004, Revised 30 July 2004, Available online 8 December 2004.

论文官网地址:https://doi.org/10.1016/j.jcss.2004.10.013