An adaptive pattern analysis system for isolating EMI

摘要

Electromagnetic interference (EMI) is any unwanted signal which interferes with the normal function of electronic devices. The EMI characteristics of these devices govern their ability to co-exist with other machines in an electromagnetically complex environment. Identification and removal of an EMI source is often necessary and represents a formidable pattern analysis problem. This paper presents generalizations of manual tests, which are usually done with single devices, to computerized testing of complex assemblies of devices. The procedures developed are adaptive in nature and suitable for use in extremely noisy environments.