Looking for representative fit models for apparel sizing

作者:

Highlights:

• Identification of optimal fit models to improve size fitting

• Outlier detection to optimize the companies' market share

• Hierarchical partitioning around medoids (HIPAM) clustering algorithm applied to anthropometric data

• Apparel sizing

摘要

This paper is concerned with the generation of optimal fit models for use in apparel design. Representative fit models or prototypes are important for defining a meaningful sizing system. However, there is no agreement among apparel manufacturers and each one has their own prototypes and size charts i.e. there is a lack of standard sizes in garments from different apparel manufacturers.

论文关键词:HIPAM,Hierarchical tree,Partitioning around medoids,Fit models,Mean split silhouette,INCA statistic

论文评审过程:Received 15 February 2013, Revised 23 July 2013, Accepted 23 July 2013, Available online 1 August 2013.

论文官网地址:https://doi.org/10.1016/j.dss.2013.07.007