Detecting multiple texture planes using local spectral distortion

摘要

This paper presents a spectral method for identifying multiple texture planes. We commence by showing how pairs of spectral peaks can be used to make direct estimates of the slant and tilt angles. Our method commences by computing the affine distortion matrices for pairs of corresponding spectral peaks. We show that the directions of the eigenvectors of the affine distortion matrices can be used to estimate local planar pose. The leading eigenvector points in the tilt direction and the direction of the second eigenvector can be used to estimate the slant direction. By searching for clusters in the computed slant and tilt angles, we locate multiple texture planes. We apply the method to a variety of real-world and synthetic imagery.