An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process

摘要

This research examines the electrical conductive particles of anisotropic conductive film (ACF) during the laminate manufacturing process for liquid crystal displays (LCD) and adopts an improved pattern match method to apply on-line automatic and relevant measurement inspections.The focus of this research is describing and identifying feature images. We aim to improve the traditional pattern match methods including the gray scale designs, adaptive pattern matrix, and adaptive feature weight pattern to reduce the system function errors and to enable more efficient and quicker pattern searches and matches for full-size images.