The modified Beckmann–Kirchhoff scattering theory for rough surface analysis

摘要

This paper focusses on how reflectance models based on scattering theory and reported in the physics literature can be used for making estimates of surface roughness parameters using reflectance measurements obtained with a digital camera. We commence by reviewing the Beckmann–Kirchhoff (B–K) scatter theory, and the recent modification to it by Vernold and Harvey. We show how this model can be used to estimate surface roughness parameters for dielectric surfaces using pixel brightness measurements. Using the roughness parameter measurements we compare the model with reflectance measurements from the CUReT database. This comparison shows that the Vernold–Harvey modification of the B–K model gives a better fit to data than the Oren–Nayar model for certain types of rough surface.