An efficient estimator of pattern recognition system error probability

摘要

A new estimator of system error probability is proposed. The estimator combines the average conditional error method and the empirical error count method so that all the information available to the designer (test and reference data set samples and their labels) can be utilized most efficiently. It is shown that the proposed estimator is unbiased and has a lower variance than the average conditional error estimator proposed by Kittler and Devijver.(5)