Syntactic pattern recognition for the recognition of bright spots

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摘要

Syntactic pattern recognition techniques are applied to the analysis of one-dimensional seismic traces and two-dimensional seismograms for the detection of bright spots. The calculation between error probability and Levenshtein distance is proposed. The system for two-dimensional seismic analysis includes three kinds of string distance computation to test the continuity of a bright spot pattern.

论文关键词:Error probability,Bright spots,Levenshtein distance,Candidate bright spots,String distance,Amplitude-dependent encoding

论文评审过程:Received 7 December 1984, Accepted 5 March 1985, Available online 19 May 2003.

论文官网地址:https://doi.org/10.1016/0031-3203(85)90012-3