Measuring knowledge exploration distance at the patent level: Application of network embedding and citation analysis
作者：
Highlights：
• We suggest a knowledge exploration distance indicator applicable to individual patents
• We vectorize patents using classification codes and pre-trained IPC embedding results
• We compare the position between a citing patent and cited patents in the vector space
• The novel degree of technological association in a citation relationship is measured
摘要
•We suggest a knowledge exploration distance indicator applicable to individual patents•We vectorize patents using classification codes and pre-trained IPC embedding results•We compare the position between a citing patent and cited patents in the vector space•The novel degree of technological association in a citation relationship is measured
论文关键词：Knowledge exploration distance,Patent citation,Network embedding,Patent classification code
论文评审过程：Received 9 April 2021, Revised 19 March 2022, Accepted 24 March 2022, Available online 5 April 2022, Version of Record 5 April 2022.
论文官网地址：https://doi.org/10.1016/j.joi.2022.101286
